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32篇 您的检索式:作者名="Hellgren, N"
    题名 作者 年代 出处 被引量
1Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy 显示文摘Hellgren N Guo J Sathe C 2001Appl Phys Lett2001,79,:1
2Mechanical and tribological properties of CNx films deposited by reactive magnetron sputtering显示文摘BroitmanE Hellgren N Wanstrand O 2001Wear2001,,248:1
3Rapid screening for improved solubility of small human proteins produced as fusion proteins in Escherichia coli 显示文摘HAMMARSTROM M HELLGREN N BERG S V 2002Protein Science2002,11,:1
4Growth, structure, and mechanical properties of CNxHy films deposited by dc magnetron sputtering in N2/Ar/H2 discharges 显示文摘Hellgren N Johansson M P Hjorvarsson B 2000Journal of Vacuum Science & Technology A2000,18,5:1
5Carbon nitride nanotubulite-densely-packed and well-aligned tubular nanostructures显示文摘Suenaga K Johansson M P Hellgren N st al 1999Chemical Physics Letters1999,300,56:1
6Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques 显示文摘Hellgren N Guo J Luo Y 2005Thin Solid Films2005,471,:1
7Growth of poly-and sin-gle-crystal ScN on MgO(001):role of low-energy N2+irradia-tion in determining texture,microstructure evolution,and me-chanical properties显示文摘Gall D Petrov I Hellgren N 1998J Appl Phys1998,84,:1
8Nitrogen 1s electron binding energy assignment in carbon nitride thin films with different structures显示文摘Zheng W T Xing K Z Hellgren N 1997J Electron Spectrosc Relat Phenom1997,87,:1
9Immo bilization of collared peccaries (Tayassu tajacu) and feral hogs (Sus scrofa ) with Telazol and xylazine 显示文摘GABOR T M HELLGREN E C SILVY N J 1997J Wildl Dis1997,33,1:1
10Thermal stability of carbon nitride thin films显示文摘Hellgren N Lin N Broitman E 2001J Mater Res2001,,11:1
11Mechanical and tribological properties of CNx films deposited by reactive magnetron sputtering显示文摘Broitman E Hellgren N Wnstrand O 2001Wear2001,248,:1
12Nitrogen 1s electron binding energy assignment in carbon nitride thin films with different structures显示文摘ZHENG W T XING K Z HELLGREN N 1997Electron Spectroscopy and Related Phenomena1997,87,:1
13Rapid screening for improved solubility of small human proteins produced as fusion proteins in Escherichia coli显示文摘HAMMARSTOM M HELLGREN N VAN D B 2002Protein Science2002,,11:1
14Rapid screening for improved solubility of small human proteins produced as fusion proteins in Escherichia coli显示文摘HAMMARSTROM M HELLGREN N VAN D B 2002Protein Science2002,,11:1
15Nitrogen ls Electron Binding Energy Assignment in Carbon Nitride Thin Films with Different Structures 显示文摘ZHENG Wei-Tao XING K Z Hellgren N 1997J Electron Spectroscopy Relat Phenom1997,87,:1
16Nitrogen Is electron binding energy assignment in carbon nitride thin films with different structures 显示文摘Zheng W T Xing K Z Hellgren N 1997Electron Spectroscopy and Related Phenomena1997,87,:1
17Nitrogen ls electron binding assignment in carbon nitride thin films with different structures显示文摘ZHENG W T XING K Z HELLGREN N 1997J Electron Spectrosc Relat Phenom1997,87,:1
18Refined crystal structm of a superoxide dismutase from the hyperthermophilic archaeon Sulfolobus acidocaldarius at 2,2 A resolution显示文摘Knapp S Kardinahl S Hellgren N 1999J Mol Biol1999,285,:1
19显示文摘Hellgren N Johansson M P Broitman E 1999Phys Rev B1999,59,7:1
20N1s Electron Binding Energies of CN_x Thin Films Grown by Magnetron Sputtering at Different Temperature显示文摘Carbon nitride thin films deposited using dc unbalanced magnetron sputtering system have been analyzed by X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FT1R) and Raman spectroscopy. The XPS data show that N1s binding states depend on substrate temperature Ts, in which the peak at 400.0 eV increases with Ts, whereas the peak at 398.3 eV decreases with Ts slightly On the basis of XPS, FT1R and Raman spectra, the assignment of N1s electron binding energies was made. The peak at 400.0 eV is attributed to N atoms bonded to sp2 coordinated C atoms. The peak at 398.3 eV is attributed to N atoms bonded to sp3 coordinated C atoms as well as N C bonds.Zheng, WT Xing, KZ Hellgren, N Ivanov, I Salaneck, WS Sundgren, JE 1998Journal of Materials Science & Technology1998,14,1:1
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